The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements

0551131 - ÚPT 2022 RIV US eng A - Abstrakt
Konvalina, Ivo - Zouhar, Martin - Daniel, Benjamin - Paták, Aleš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements.
Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 612-615. ISSN 1431-9276. E-ISSN 1435-8115
Institucionální podpora: RVO:68081731
Klíčová slova: time of flight spectrometer * inelastic mean free path * energy loss spectrum * density functional theory
Obor OECD: Electrical and electronic engineering
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086

Both electron microscopy and spectroscopy are powerful tools to gain information about structure and properties of various materials. We have developed a unique ultra-high vacuum instrument capable of analyzing samples via transmitted electrons in two complementary modes. These two modes are a standard microscopic regime in the range of energies from 5 keV down to few eV and a time-of-flight (ToF) method. Standard ToF spectrometers operate in energy range above 500 eV and detect reflected electrons. Our new ToF spectrometer is able to operate with energies of incident electrons below 300 eV. It detects transmitted electrons since the drift tube and detector are conveniently located below the analyzed sample. In order to apply these methods and interpret corresponding results correctly, deep understanding of electron transport phenomena in solids is required.
Trvalý link: http://hdl.handle.net/11104/0326576