Bismuth layer properties in the ultrathin Bi–FeNi multilayer films probed by spectroscopic ellipsometry

0547875 - FZÚ 2022 RIV US eng J - Článek v odborném periodiku
Kovaleva, N. N. - Chvostová, Dagmar - Pacherová, Oliva - Muratov, A.V. - Fekete, Ladislav - Sherstnev, I.A. - Kugel, K.I. - Pudonin, F.A. - Dejneka, Alexandr
Bismuth layer properties in the ultrathin Bi–FeNi multilayer films probed by spectroscopic ellipsometry.
Applied Physics Letters. Roč. 119, Nov (2021), č. článku 183101. ISSN 0003-6951. E-ISSN 1077-3118
Grant CEP: GA ČR(CZ) GA20-21864S; GA MŠMT(CZ) EF16_019/0000760
Grant ostatní: OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
Institucionální podpora: RVO:68378271
Klíčová slova: Bismuth * layer, properties * ultrathin Bi–FeNi * multilayer films * spectroscopic ellipsometry
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 3.971, rok: 2021
Způsob publikování: Omezený přístup
https://doi.org/10.1063/5.0069691

Using wideband (0.5–6.5 eV) spectroscopic ellipsometry, we study ultrathin [Bi(0.6–2.5 nm)–FeNi(0.8,1.2 nm)]N multilayer films grown by rf sputtering deposition, where the FeNi layer has a nanoisland structure and its morphology and magnetic properties change with decreasing the nominal layer thickness. From multilayer model simulations of the ellipsometric angles, WðxÞ and DðxÞ, complex (pseudo)dielectric function spectra of the Bi layer were extracted. The obtained results demonstrate that the Bi layer can possess the surface metallic conductivity, which is strongly affected by the morphology and magnetic properties of the nanoisland FeNi layer in GMR-type Bi–FeNi multilayer structures.
Trvalý link: http://hdl.handle.net/11104/0324047