Effect of lattice excitations on transient near-edge x-ray absorption spectroscopy

0546814 - FZÚ 2022 RIV US eng J - Článek v odborném periodiku
Rothenbach, N. - Gruner, M.E. - Ollefs, K. - Schmitz-Antoniak, C. - Salamon, S. - Zhou, P. - Li, R. - Mo, M. - Park, S. - Shen, X. - Weathersby, S. - Yang, J. - Wang, X.J. - Šipr, Ondřej - Ebert, H. - Sokolowski-Tinten, K. - Pentcheva, R. - Bovensiepen, U. - Eschenlohr, A. - Wende, H.
Effect of lattice excitations on transient near-edge x-ray absorption spectroscopy.
Physical Review B. Roč. 104, č. 14 (2021), č. článku 144302. ISSN 2469-9950. E-ISSN 2469-9969
Institucionální podpora: RVO:68378271
Klíčová slova: XAS * metal/insulator heterostructure * laser excitation * electron diffraction
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 3.908, rok: 2021
Způsob publikování: Omezený přístup
https://doi.org/10.1103/PhysRevB.104.144302

Time-dependent and constituent-specific spectral changes in soft near-edge x-ray absorption spectroscopy (XAS) of an [Fe/MgO]8 metal/insulator heterostructure after laser excitation are analyzed at the O K-edge with picosecond time resolution. The oxygen absorption edge of the insulator features a uniform intensity decrease of the fine structure at elevated phononic temperatures, which can be quantified by a simple simulation and fitting procedure presented here. Combining XAS with ultrafast electron diffraction measurements and ab initio calculations demonstrates that the transient intensity cha nges in XAS can be assigned to a transient lattice temperature. Thus, the sensitivity of transient near-edge XAS to phonons is demonstrated.
Trvalý link: http://hdl.handle.net/11104/0323220