XPS as an advanced method for analysis of organic materials

0540756 - FZÚ 2021 RIV CZ eng A - Abstrakt
Artemenko, Anna - Štenclová, Pavla - Babčenko, Oleg - Wågberg, T. - Segervald, J. - Jia, X. - Shchukarev, A. - Marton, M. - Vojs, M. - Kromka, Alexander
XPS as an advanced method for analysis of organic materials.
Book of Abstracts of the 30^th Joint Seminar of the Development of Materials Science in Research and Education. Praha: Institute of Physics of the Czech Academy of Sciences, 2020 - (Kožíšek, Z.; Král, R.; Zemenová, P.). s. 17-17. ISBN 978-80-907237-1-9.
[Joint Seminar of the Development of Materials Science in Research and Education /30./. 07.09.2020-11.09.2020, Pavlov]
Grant CEP: GA MŠMT(CZ) EF18_053/0016627; GA ČR(CZ) GJ20-00925Y
Grant ostatní: OP VVV - Mobility FZU 2(XE) CZ.02.2.69/0.0/0.0/18_053/0016627
Institucionální podpora: RVO:68378271
Klíčová slova: XPS * amino acids * diamond * DLC * cryogenic
Obor OECD: Physical chemistry

XPS is known as a surface-sensitive method that allows us to obtain quantitative information about the chemical composition of organic materials. Here we present technological challenges in XPS analysis of AAs and cells (geobacter, Algae). The first part focuses on an understanding of the actual mechanisms of AAs interaction with H-/O-terminated NCD and DLC films using XPS. The detailed processing of XPS data revealed the dependence of AAs adhesion on the surface termination of carbon-based materials. The second part focuses on the investigation of intact interfaces of centrifuged wet pastes of geobacter and Algae followed by XPS at liquid nitrogen temperatures. The detailed XPS analysis of C 1s, O 1s, N 1s and S 2p peaks was discussed. This work was supported by project ESIF and MEYS (Project “FZU- researchers, technical and administrative staff mobility” – CZ.02.2.69/0.0/0.0/18_053/0016627), by project VEGA 1/0554/20 and by the Czech Science Foundation (project No. 20-00925Y).
Trvalý link: http://hdl.handle.net/11104/0318361