High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I

0534293 - ÚJF 2021 RIV US eng J - Článek v odborném periodiku
Mikula, Pavol - Šaroun, Jan - Stammers, James H. - Em, V.
High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I.
Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques. Roč. 14, SUPPL 1 (2020), s. 146-150. ISSN 1027-4510
Grant CEP: GA MŠMT LM2015048; GA MŠMT LM2010011; GA MŠMT LM2015056
Institucionální podpora: RVO:61389005
Klíčová slova: powder diffraction * focusing * bent crystal analyzer
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Způsob publikování: Omezený přístup
https://doi.org/10.1134/S1027451020070320

Three-axis setup using a bent perfect crystal monochromator and analyzer was tested in the diffraction study of alpha-Fe(211) polycrystalline pins with diameters of 8 and 2 mm. After the optimal conditions were realized at a neutron wavelength of 0.162 nm, a high angular resolution was achieved up to FWHM (Delta d/d) = 4.7 x 10(-3)and 3.5 x 10(-3)for 8 and 2 mm pins, respectively, within the range of curvatures of the analyzer used. However, open beams were used, i.e., without Soller collimators. Such a diffraction setting can be used in powder diffraction studies, namely, in the analysis of small changes in the lattice parameters or small changes in the diffraction profile due to the application of an external load.
Trvalý link: http://hdl.handle.net/11104/0312522