Soft X-ray laser ablation for nano-scale chemical mapping microanalysis

0533630 - FZÚ 2021 RIV GB eng J - Článek v odborném periodiku
Bleiner, D. - Juha, Libor - Qu, D.
Soft X-ray laser ablation for nano-scale chemical mapping microanalysis.
Journal of Analytical Atomic Spectrometry. Roč. 35, č. 6 (2020), s. 1051-1070. ISSN 0267-9477. E-ISSN 1364-5544
GRANT EU: European Commission(XE) 654148 - LASERLAB-EUROPE
Institucionální podpora: RVO:68378271
Klíčová slova: laser ablation * soft X-ray laser * laser-assisted microanalysis * nano-scale chemical mapping microanalysis
Obor OECD: Optics (including laser optics and quantum optics)
Impakt faktor: 4.023, rok: 2020
Způsob publikování: Open access
https://doi.org/10.1039/c9ja00366e

Laser-assisted microanalysis offers the advantage of determining the spatially resolved compositions in 3D. Scanning a material with a sequence of sampling laser pulses and acquiring online the related spectra allow one to map the lateral and depth distribution of elements and molecules. Disruptive improvements in laser technology are demonstrated utilizing recently self-developed extreme ultraviolet or soft X-ray lasers. A significant enhancement of the resolution is accomplished thanks to a much shorter wavelength, with respect to state-of-the-art commercial lasers. As the most innovative aspect, the sampling efficiency is enhanced using “ionizing radiation”, i.e. directly activating the target material. The analytical setup is simplified to a sampling source and detector, i.e. without the need for a secondary ionization or excitation source as in some state-of-the-art analytical systems.

Trvalý link: http://hdl.handle.net/11104/0311962