A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam

0523920 - ÚJF 2021 RIV GB eng J - Článek v odborném periodiku
Vezhlev, E. - Ioffe, A. - Mattauch, S. - Staringer, S. - Ossovyi, V. - Felder, C. - Huger, E. - Vacík, Jiří - Tomandl, Ivo - Hnatowicz, Vladimír - Chen, C. - Notten, P. H. L. - Bruckel, T.
A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam.
Radiation Effects and Defects in Solids. Roč. 175, 3-4 (2020), s. 342-355. ISSN 1042-0150. E-ISSN 1029-4953
Grant CEP: GA ČR GA18-07619S
Institucionální podpora: RVO:61389005
Klíčová slova: neutron depth profiling * in situ * operando methods * near-surface analysis * thin-film lithium batteries
Obor OECD: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Impakt faktor: 1.141, rok: 2020
Způsob publikování: Open access
https://org.doi/10.1080/10420150.2019.1701466

A new neutron depth profiling (NDP) spectrometer has been designed and built for the use at a high intensity focused cold neutron beam of the reflectometer MARIA at the Heinz Maier-Leibnitz Zentrum (MLZ, Germany). The extremely high neutron flux at the sample position of MARIA joined with the multiple charged particle detectors allows less than 10 s sampling rate and paves the way to study the kinetics of Li ions in thin-film microbatteries. The performance of the spectrometer with standard calibration samples and amorphous thin films is presented, possibilities to operando study the Li distribution inside thin-film rechargeable lithium batteries are discussed.
Trvalý link: http://hdl.handle.net/11104/0308210