HHG beam wavefront characterization at 30 nm

0522543 - FZÚ 2020 RIV CH eng C - Konferenční příspěvek (zahraniční konf.)
Homer, Pavel - Rus, Bedřich - Hřebíček, Jan - Nejdl, Jaroslav
HHG beam wavefront characterization at 30 nm.
X-Ray Lasers 2016: Proceedings of the 15th International Conference on X-Ray Lasers. Cham: Springer International Publishing, 2018 - (Kawachi, T.; Bulanov, S.; Daido, H.; Kato, Y.), s. 93-99. Springer Proceedings in Physics, 202. ISBN 978-3-319-73024-0. ISSN 0930-8989.
[International Conference on X-Ray Lasers /15./, ICXRL 2016. Nara (JP), 22.05.2016-27.05.2016]
Institucionální podpora: RVO:68378271
Klíčová slova: X ray lasers * laser produced plasmas
Obor OECD: Optics (including laser optics and quantum optics)

For the purpose of characterization and improvement of the HHG (High-order Harmonics Generation) eXtreme Ultra-Violet (XUV) coherent beam at the wavelength 30 nm, we developed a unique wavefront sensor based on PDI (Point Diffraction Interferometer) technique. A simple self-referencing monolithic device produces interferometric pattern with encoded information about the wavefront profile of the measured beam. We describe the development, fabrication, and alignment of the sensor, as well as the obtained results and their interpretation.
Trvalý link: http://hdl.handle.net/11104/0307019