Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

0517624 - FZÚ 2020 RIV US eng J - Článek v odborném periodiku
Vagovič, Patrik - Sato, T. - Mikeš, L. - Mills, G. - Graceffa, R. - Mattsson, F. - Villanueva-Perez, P. - Ershov, A. - Faragó, T. - Uličný, J. - Kirkwood, H. - Letrun, R. - Mokso, R. - Zdora, M.-Ch. - Olbinado, M.P. - Rack, A. - Baumbach, T. - Schulz, J. - Meents, A. - Chapman, H.N. - Mancuso, A.P.
Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources.
Optica. Roč. 6, č. 9 (2019), s. 1106-1109. ISSN 2334-2536. E-ISSN 2334-2536
Institucionální podpora: RVO:68378271
Klíčová slova: modern emerging technologies * additive manufacturing * bioprinting * new material production
Obor OECD: Nuclear physics
Impakt faktor: 9.778, rok: 2019
Způsob publikování: Open access

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.
Trvalý link: http://hdl.handle.net/11104/0302929