Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons

0510307 - ÚPT 2020 US eng A - Abstrakt
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons.
Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 482-483. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
Grant CEP: GA TA ČR(CZ) TN01000008
Institucionální podpora: RVO:68081731
Klíčová slova: two-dimensional (2D) materials * microscopy and spectroscopy * low energy electrons
Obor OECD: Electrical and electronic engineering

Two-dimensional (2D) materials have recently become very popular because of their interesting properties and rich application potential. Progress in production of new high quality 2D materials necessitates to study and analyze these materials. Such studies can be performed via scanning electron microscopy with slow and very slow electrons and time-of-flight (ToF) spectroscopy.
Trvalý link: http://hdl.handle.net/11104/0300816