Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation

0508216 - ÚPT 2020 RIV SK eng J - Článek v odborném periodiku
Fiala, P. - Bartušek, Karel - Dědková, J. - Kadlec, R. - Dohnal, P.
Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation.
Measurement Science Review. Roč. 19, č. 4 (2019), s. 144-152. ISSN 1335-8871. E-ISSN 1335-8871
Institucionální podpora: RVO:68081731
Klíčová slova: nanomaterials * multilayered material * resonance * periodic system * electromagnetic wave * X-ray * gamma-ray * antireflection * shielding
Obor OECD: Nuclear physics
Impakt faktor: 0.900, rok: 2019
Způsob publikování: Open access
https://content.sciendo.com/view/journals/msr/19/4/article-p144.xml

We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum, the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell's law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively.
Trvalý link: http://hdl.handle.net/11104/0299189