Kelvin probe force microscopy

0501462 - FZÚ 2019 RIV CH eng M - Část monografie knihy
Ondráček, Martin - Hapala, Prokop - Švec, Martin - Jelínek, Pavel
Imaging charge distribution within molecules by scanning probe microscopy.
Kelvin probe force microscopy. Cham: Springer International Publishing, 2018 - (Sadewasser, S.; Glatzel, T.), s. 499-518. Springer Series in Surface Sciences, 65. ISBN 978-3-319-75686-8
Grant CEP: GA ČR GJ17-24210Y
Grant ostatní: AV ČR(CZ) Praemium Academiae
Institucionální podpora: RVO:68378271
Klíčová slova: charge distribution * surfaces * molecules * Kelvin probe force microscopy * scanning quantum dot microscopy * high resolution atomic force microscopy
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)

Different methods which provide information about charge distribution at atomic or submolecular scale are discussed, including Kelvin probe force microscopy, scanning quantum dot microscopy or high-resolution imaging with functionalized tips.
Trvalý link: http://hdl.handle.net/11104/0293485