Počet záznamů: 1
Correlative imaging using CL and STEM detector in a SEM
- 1.0501297 - ÚPT 2019 CZ eng A - Abstrakt
Skoupý, Radim - Krzyžánek, Vladislav
Correlative imaging using CL and STEM detector in a SEM.
Mikroskopie 2018. Praha: Československá mikroskopická společnost, 2018. s. 26.
[Mikroskopie 2018. 14.05.2018-16.05.2018, Lednice na Moravě]
Grant CEP: GA ČR GA17-15451S; GA TA ČR TG03010046; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: correlative imaging * STEM * SEM
Obor OECD: Electrical and electronic engineering
Nowadays, a correlative imaging is one of the main topics in the field of electron microscopy, because it enables to study a sample from different points of view by comparing several different signale induced by incident primary electron beam.
Trvalý link: http://hdl.handle.net/11104/0293289
Počet záznamů: 1