SiC detector for high helium energy spectroscopy

0493863 - ÚJF 2019 RIV NL eng J - Článek v odborném periodiku
Torrisi, L. - Havránek, Vladimír - Cutroneo, Mariapompea - Macková, Anna - Calcagno, L. - Cannavo, A. - Torrisi, A.
SiC detector for high helium energy spectroscopy.
Nuclear Instruments & Methods in Physics Research Section A. Roč. 903, č. 9 (2018), s. 309-316. ISSN 0168-9002. E-ISSN 1872-9576
Grant CEP: GA MŠMT LM2015056; GA ČR(CZ) GBP108/12/G108
Institucionální podpora: RVO:61389005
Klíčová slova: SiC detector * high energy ions * ion detection * RBS analysis * kinematic factor
Obor OECD: Nuclear physics
Impakt faktor: 1.433, rok: 2018

SiC Schottky detectors, having a superficial active zone up to 80 micron depths and a thin surface metallization, are adapt to detect high energetic ions. In order to demonstrate their detection ability with high-energy resolution, a helium Rutherford backscattering spectroscopy (RBS) was employed to evaluate their detection efficiency, energy resolution in the region 1.0 - 6.0 MeV alpha ions, depth resolution and dependence on the ion beam current. The detector parameters dependencies on the surface passivation layers, ion energy and current are presented. The comparison of RBS analysis using a traditional barrier silicon detector is investigated, and the differences with SiC detector is presented and discussed.
Trvalý link: http://hdl.handle.net/11104/0287147