Structure of epitaxial SrIrO.sub.3./sub. perovskite studied by interference between X-ray waves diffracted by the substrate and the thin film

0487516 - FZÚ 2018 RIV GB eng J - Článek v odborném periodiku
Horák, L. - Kriegner, D. - Liu, J. - Frontera, C. - Martí, Xavier - Holý, V.
Structure of epitaxial SrIrO₃ perovskite studied by interference between X-ray waves diffracted by the substrate and the thin film.
Journal of Applied Crystallography. Roč. 50, Apr (2017), s. 385-398. ISSN 0021-8898. E-ISSN 1600-5767
Grant CEP: GA ČR GB14-37427G; GA MŠMT(CZ) LG13058
Institucionální podpora: RVO:68378271
Klíčová slova: perovskites * epitaxial layers * X-ray diffraction * interference
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 3.422, rok: 2017

A high-pressure metastable orthorhombic phase of SrIrO3 perovskite has been epitaxially stabilized on several substrates (DyScO3, GdScO3, NdScO3 and SrTiO3) in the form of thin monocrystalline layers with (110) surface orientation. The unit-cell parameters of the pseudomorphic thin SrIrO3 layers depend on the biaxial strain imposed by the various substrates due to the different lattice mismatches of the particular substrate and the bulk orthorhombic SrIrO3 structure. Using X-ray diffractometry, it is shown that both compressive and tensile strain increase the lattice parameters a and b, while the angle gamma scales with the applied strain, being smaller or larger than 90 degrees for compressive or tensile strain, respectively, resulting in a small monoclinic distortion of the layer unit cell.
Trvalý link: http://hdl.handle.net/11104/0282168