Počet záznamů: 1
What’s next in Scanning Low Energy Electron Microscopy?
- 1.0481148 - ÚPT 2018 AT eng A - Abstrakt
Müllerová, Ilona - Mikmeková, Šárka - Mikmeková, Eliška - Frank, Luděk
What’s next in Scanning Low Energy Electron Microscopy?
Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 22.
[SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
Grant CEP: GA TA ČR(CZ) TE01020118
GRANT EU: European Commission(XE) 606988 - SIMDALEE2
Institucionální podpora: RVO:68081731
Klíčová slova: SLEEM * primary beam energy * signal electrons
Obor OECD: Nano-materials (production and properties)
The optimum contrast can be found in the SLEEM for each specimen, when proper primary beam energy and the collection of the signal electrons by the detector align.
Trvalý link: http://hdl.handle.net/11104/0276751
Počet záznamů: 1