Počet záznamů: 1
Lead-silicate glass surface sputtered by an argon cluster ion beam investigated by XPS
- 1.0479273 - FZÚ 2018 RIV NL eng J - Článek v odborném periodiku
Zemek, Josef - Jiříček, Petr - Houdková, Jana - Jurek, Karel - Gedeon, O.
Lead-silicate glass surface sputtered by an argon cluster ion beam investigated by XPS.
Journal of Non-Crystalline Solids. Roč. 469, Aug (2017), s. 1-6. ISSN 0022-3093. E-ISSN 1873-4812
Grant CEP: GA MŠMT LM2015088; GA ČR(CZ) GA15-12580S
Institucionální podpora: RVO:68378271
Klíčová slova: lead-silicate glass * XPS * BO * NBO * Argon duster ion beam sputtering * X-ray irradiation
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
Impakt faktor: 2.488, rok: 2017
We apply Ar cluster ion beam sputtering, known as a very gentle technique with respect to the changes in surface chemistry, to air-exposed lead-silicate glass surfaces analyzed by high-energy resolved core-level photoelectron spectroscopy.
Trvalý link: http://hdl.handle.net/11104/0275276
Počet záznamů: 1