Počet záznamů: 1  

Devices based on InGaN/GaN multiple quantum well for scintillator and detector applications

  1. 1.
    0477154 - FZÚ 2018 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
    Hospodková, Alice - Pangrác, Jiří - Kuldová, Karla - Nikl, Martin - Pacherová, Oliva - Oswald, Jiří - Hubáček, Tomáš - Zíková, Markéta - Brůža, P. - Pánek, D. - Blažek, K. - Ledoux, G. - Dujardin, C. - Heuken, M. - Hulicius, Eduard
    Devices based on InGaN/GaN multiple quantum well for scintillator and detector applications.
    Fourth Conference on Sensors, MEMS, and Electro-Optic Systems. Bellingham: SPIE, 2017 - (du Plessis, M.), s. 1-15, č. článku 1003617. Proceedings of SPIE, 10036. ISBN 978-151060513-8. ISSN 0277-786X.
    [South African Conference on Sensors, MEMS and Electro-Optical Systems (SMEOS) /4./. Skukuza (ZA), 18.09.2016-20.09.2016]
    Grant CEP: GA MŠMT LM2015087; GA MŠMT LO1603; GA ČR GA16-15569S
    GRANT EU: European Commission(XE) CZ.2.16/3.1.00/24510; European Commission(XE) 690599 - ASCIMAT
    Institucionální podpora: RVO:68378271
    Klíčová slova: gallium nitride * indium gallium nitride * quantum wells * scintillators * sensors * luminescence * excitons * scintillation * radiation * resistance
    Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)

    InGaN/GaN multiple QW structures were prepared by MOVPE and characterized by high resolution X-ray diffraction. We demonstrate structure suitability for scintillator application including a unique measurement of wavelength-resolved scintillation response under nanosecond pulse soft X-ray source. The photo-, radio- and cathodo-luminescence were measured. We observed double peak luminescence governed by different recombination mechanisms: exciton in QW and related to defects. We have shown that for obtaining fast and intensive luminescence response proper structure design is required. The radioluminescence decay time of QW exciton maximum decreased from 16 ns to 4 ns when the QW thickness was decreased from 2.4 to 2 nm. We have proved suitability of InGaN/GaN structures for fast scintillator application for electron or other particle radiation detection. For x-ray detection the fast scintillation response would be hard to achieve due to the dominant slow defect luminescence maximum.
    Trvalý link: http://hdl.handle.net/11104/0273529

     
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