Magnetoresistance effects associated with various electric conduction mechanisms in nanostructured [C/FeCo]n multilayers

0470617 - ÚPT 2017 RIV NL eng J - Článek v odborném periodiku
Zeng, Y.P. - Liu, Z.W. - Mikmeková, Eliška
Magnetoresistance effects associated with various electric conduction mechanisms in nanostructured [C/FeCo]n multilayers.
Journal of Magnetism and Magnetic Materials. Roč. 421, January (2017), s. 39-43. ISSN 0304-8853. E-ISSN 1873-4766
Institucionální podpora: RVO:68081731
Klíčová slova: magnetoresistance * thin film * microstructure * conduction regime
Obor OECD: Coating and films
Impakt faktor: 3.046, rok: 2017

An evolution of magnetoresistance (MR) mechanism with the film structure was discovered in nanostructured [C/FeCo]n thin films fabricated by magnetron sputtering. The discontinuous multilayer nanogranular structure was confirmed by microstructure characterization. As the layer number n increased, the MR value of the film changed from positive to negative. The fitting curves of lnR−T−1/2 and lnR−T−1/4 show that there is a transition of the conduction regime in the temperature range of 2–300 K. The significant different MR effects at various conduction regimes indicated that the type of transport regime plays an important role in MR origin.
Trvalý link: http://hdl.handle.net/11104/0268199