Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

0465206 - ÚPT 2017 RIV US eng J - Článek v odborném periodiku
Skoupý, Radim - Nebesářová, Jana - Krzyžánek, Vladislav
Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections.
Microscopy and Microanalysis. Roč. 22, S3 (2016), s. 926-927. ISSN 1431-9276. E-ISSN 1435-8115
Grant CEP: GA ČR(CZ) GA14-20012S; GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731 ; RVO:60077344
Klíčová slova: TEM * STEM * EFTEM
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika; JA - Elektronika a optoelektronika, elektrotechnika (BC-A)
Impakt faktor: 1.891, rok: 2016

Low voltage TEM and STEM (transmission and scanning transmission electron microscope) can be regarded as the method of choice for many structural studies of very thin biological samples like ultrathin sections, viruses etc.. Usually, in a conventional TEM (typical acceleration voltage 60 – 300 kV) the image contrast is enhanced by staining using salts of heavy metals (e.g., uranyl acetate, lead citrate). Low voltage STEM allows to image unstained samples that usually show sufficient contrast, but in some cases the staining can be useful. An important parameter for imaging is a sensitivity of the sample to degradation by electron beam. There have been not many studies describing quantitatively the mass loss of the resin sections; the most comprehensive work was performed on the dedicated STEM for molecular mass measurements done at 80 keV, or even at higher electron energies done by EFTEM. The author in [6] describes that polymers stained with a heavy metal should therefore damage more rapidly through the secondary electron mechanism and higher cross sections for scattering.
Trvalý link: http://hdl.handle.net/11104/0263873