Stabilized semiconductor laser source for high-resolution interferometry

0464548 - ÚPT 2017 RIV GB eng C - Konferenční příspěvek (zahraniční konf.)
Řeřucha, Šimon - Yacoot, A. - Pham, Minh Tuan - Čížek, Martin - Hucl, Václav - Lazar, Josef - Číp, Ondřej
Stabilized semiconductor laser source for high-resolution interferometry.
EUSPEN 2016. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Nottingham: Euspen, 2016, 1.3.1-1.3.3. ISBN 978-095667908-6.
[EUSPEN 2016. International Conference of the European Society for Precision Engineering and Nanotechnology /16./. Nottingham (GB), 30.05.2016-03.06.2016]
Grant CEP: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01; GA ČR GB14-36681G; GA TA ČR TE01020233
Institucionální podpora: RVO:68081731
Klíčová slova: DBR * diode laser * iodine stabilization * laser interferometry * optical metrology
Kód oboru RIV: BH - Optika, masery a lasery

We have assembled an experimental iodine stabilized Distributed Bragg Reflector (DBR) diode based laser system lasing at a wavelength that is in a close proximity to the wavelength of a stabilized He-Ne lasers traditionally used for metrological applications . The aim was to verify whether such a system could be used as an alternative to the He-Ne laser while yielding wider optical frequency tuning range, higher output power and high frequency modulation
capability. We have measured the basic characteristics of the laser source and then we have compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser with a series of experimental arrangements similar to those usually found in laser interferometry and displacement metrology applications. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano)metrology since it provides more output power and advanced tunability options than stabilized He-Ne lasers while maintaining fundamental requirements such as the frequency stability, coherence length and also a defined traceability.
Trvalý link: http://hdl.handle.net/11104/0265157