High resolution micro-CT of low attenuating organic materials using large area photon-counting detector

0458288 - ÚTAM 2017 RIV GB eng J - Článek v odborném periodiku
Kumpová, Ivana - Vavřík, Daniel - Fíla, Tomáš - Koudelka_ml., Petr - Jandejsek, Ivan - Jakůbek, Jan - Kytýř, Daniel - Zlámal, Petr - Vopálenský, Michal - Gantar, A.
High resolution micro-CT of low attenuating organic materials using large area photon-counting detector.
Journal of Instrumentation. Roč. 11, č. 2 (2016), č. článku C02003. ISSN 1748-0221. E-ISSN 1748-0221
Grant CEP: GA MŠMT(CZ) LO1219
Klíčová slova: computerized tomography (CT) * computed radiography (CR) * pixelated detectors and associated VLSI electronics
Kód oboru RIV: AL - Umění, architektura, kulturní dědictví
Impakt faktor: 1.220, rok: 2016
http://iopscience.iop.org/article/10.1088/1748-0221/11/02/C02003

To overcome certain limitations of contemporary materials used for bone tissue engineering, such as inflammatory response after implantation, a whole new class of materials based on polysaccharide compounds is being developed. Here, nanoparticulate bioactive glass reinforced gelan-gum (GG-BAG) has recently been proposed for the production of bone scaffolds. This material offers promising biocompatibility properties, including bioactivity and biodegradability, with the possibility of producing scaffolds with directly controlled microgeometry. However, to utilize such a scaffold with application-optimized properties, large sets of complex numerical simulations using the real microgeometry of the material have to be carried out during the development process. Because the GG-BAG is a material with intrinsically very low attenuation to X-rays, its radiographical imaging, including tomographical scanning and reconstructions, with resolution required by numerical simulations might be a very challenging task. In this paper, we present a study on X-ray imaging of GG-BAG samples. High-resolution volumetric images of investigated specimens were generated on the basis of micro-CT measurements using a large area flat-panel detector and a large area photon-counting detector. The photon-counting detector was composed of a 10 × 10 matrix of Timepix edgeless silicon pixelated detectors with tiling based on overlaying rows (i.e. assembled so that no gap is present between individual rows of detectors). We compare the results from both detectors with the scanning electron microscopy on selected slices in transversal plane. It has been shown that the photon counting detector can provide approx. 3× better resolution of the details in low-attenuating materials than the integrating flat panel detectors. We demonstrate that employment of a large area photon counting detector is a good choice for imaging of low attenuating materials with the resolution sufficient for numerical simulations.
Trvalý link: http://hdl.handle.net/11104/0258568