0456646 - FZÚ 2016 RIV CH eng M - Část monografie knihy
Hapala, Prokop - Ondráček, Martin - Stetsovych, Oleksandr - Švec, Martin - Jelínek, Pavel
Simultaneous nc-AFM/STM measurements with atomic resolution.
Noncontact Atomic Force Microscopy. Cham: Springer International Publishing, 2015 - (Morita, S.; Giessibl, F.; Meyer, E.; Wiesendanger, R.), s. 29-49. NanoScience and Technology, 3. ISBN 978-3-319-15587-6
Grant CEP: GA ČR(CZ) GA14-02079S
Institucionální podpora: RVO:68378271
Klíčová slova: AFM * STM * DFT simulations * electron transport * atomic contrast
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
DOI: https://doi.org/10.1007/978-3-319-15588-3_3

We discuss the history and recent progress of simultaneous AFM/STM measurements with atomic resolution. We demonstrate, that the technique can provide complex information about chemical and physical processes at atomic scale as well as about material properties of surfaces and nanostructures. We briefly overview one of the most fascinating achievements, high-resolution imaging with functionalized tips.
Trvalý link: http://hdl.handle.net/11104/0257148