Scanning thermal microscopy: characterization of PLD films

0455355 - FZÚ 2016 RIV AU eng A - Abstrakt
Zeipl, Radek - Jelínek, Miroslav - Kocourek, Tomáš - Remsa, Jan - Vaniš, Jan - Navrátil, Jiří
Scanning thermal microscopy: characterization of PLD films.
COLA 2015. International Conference on Laser Ablation 2015. Program handbook. Canberra: Australian National University, 2015 - (Rode, A.). P 137. ISBN 978 0 64694 286 5.
[COLA 2015. International Conference on Laser Ablation 2015. 31.08.2015-04.09.2015, Cairns]
Institucionální podpora: RVO:68378271 ; RVO:61389013
Klíčová slova: thermoelectric * SEM * PLD
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

Thermal conductivity of thermoelectric nano-layers was studied by a scanning thermal microscope working in AC and DC current mode. The microscope’s cantilever is being heated by an electrical current and when there is a physical contact or at a very short distance between the measured sample and the cantilever, the probe temperature decreases due to power dissipation into the sample. The temperature change leads to resistance change in the probe which is evaluated using a Wheatstone bridge. The probe’s resistivity versus temperature dependency is well known, so the temperature change can be evaluated. For this purpose a simple and reliable method has been developed.
Trvalý link: http://hdl.handle.net/11104/0255985