Raman spectroscopy and AFM study of C-12 graphene/fullerenes C-70/C-13 graphene heterostructure

0454491 - ÚFCH JH 2016 RIV DE eng J - Článek v odborném periodiku
Valeš, Václav - Verhagen, Timotheus - Vejpravová, Jana - Kalbáč, Martin
Raman spectroscopy and AFM study of C-12 graphene/fullerenes C-70/C-13 graphene heterostructure.
Physica Status Solidi B. Roč. 252, č. 11 (2015), s. 2418-2422. ISSN 0370-1972. E-ISSN 1521-3951
Grant CEP: GA ČR(CZ) GAP208/12/1062
Institucionální podpora: RVO:68378271 ; RVO:61388955
Klíčová slova: atomic force microscopy * fullerences * graphene
Kód oboru RIV: CF - Fyzikální chemie a teoretická chemie
Impakt faktor: 1.522, rok: 2015

In our study, we sandwiched fullerenes C-70 in between two layers of isotopically labeled graphene and studied this heterostructure by atomic force microscopy and by Raman spectroscopy. Isotope labeling was used to distinguish between the top and the bottom graphene layers in the measured Raman spectra. We analyzed the Raman maps of isotopically labeled graphene-fullerene heterostructures and described the effect of the fullerenes on graphene layers. Apart from the peak parameters obtained directly from fitting the principal Raman modes of graphene, we evaluated strain and doping in both layers employing a correlation analysis of the positions of the G and the 2D bands. Our results show that the top layer is less doped and contains less sub-micron charge inhomogeneities than the bottom layer.
Trvalý link: http://hdl.handle.net/11104/0255177