Scanning thermal microscopy of thermoelectric nanostructures

0452133 - FZÚ 2016 DE eng A - Abstrakt
Vaniš, Jan - Zelinka, Jiří - Zeipl, Radek - Jelínek, Miroslav - Kocourek, Tomáš - Remsa, Jan - Navrátil, Jiří
Scanning thermal microscopy of thermoelectric nanostructures.
ICT & ECT2015. Book of Abstracts. Dresden: Max-Planck-Institut für Chemische Physik fester Stoffe, 2015 - (Grin, J.). PB034
[International Conference on Thermoelectrics (ICT 2015) /34./ and European Conference on Thermoelectrics (ECT 2015) /13./. 28.06.2015-02.07.2015, Dresden]
Institucionální podpora: RVO:68378271 ; RVO:61389013
Klíčová slova: thermoelectric layer * scanning thermal microscopy * PLD * laser deposition * SIMS
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

We present the development and results of a simple method for thermal conductivity char-acterization of thin thermoelectric structures using a scanning thermal microscope in pulsed current mode. With the presented method it is impossible to measure absolute thermal con-ductivity of the studied system, but only a relatively to Si substrate. We present the results of the method on the step Si substrate/layer boundary. The nano-layers of different thick-ness and different materials were for the experiments prepared from hot pressed targets by pulsed laser deposition.
Trvalý link: http://hdl.handle.net/11104/0253148