Methods applied for the characterization of Si:H thin films with embedded nanoparticles

0451880 - FZÚ 2016 RIV US eng J - Článek v odborném periodiku
Stuchlíková, The-Ha - Remeš, Zdeněk - Purkrt, Adam - Stuchlík, Jiří - Král, Karel
Methods applied for the characterization of Si:H thin films with embedded nanoparticles.
Advanced Science, Engineering and Medicine. Roč. 7, č. 4 (2015), s. 270-274. ISSN 2164-6627
Grant CEP: GA MŠMT LH12236
Institucionální podpora: RVO:68378271
Klíčová slova: electrical conductivity * activation energy * CPM * SEM * I - V characteristics * nanoparticles
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

For the characterization of multilayer diode structures, it is indispensable to measure the I-V curves, and, for photovoltaic applications, the efficiency of the transformation of solar energy to electricity. The topic of this article is to evaluate the applicability of these methods for the characterization of Si:H layers and structures, in cases when they form a matrix with implanted interlayers of nanoparticles of different types of semiconductors. We also present electroluminescence spectra in the 1.4 to 0.8 eV energy range (IR part of spectrum), measured on our recently developed setup.
Trvalý link: http://hdl.handle.net/11104/0252937