Attenuated total reflectance Fourier-transform infrared spectroscopic investigation of silicon heterojunction solar cells

0449313 - FZÚ 2016 RIV US eng J - Článek v odborném periodiku
Holovský, Jakub - De Wolf, S. - Jiříček, Petr - Ballif, C.
Attenuated total reflectance Fourier-transform infrared spectroscopic investigation of silicon heterojunction solar cells.
Review of Scientific Instruments. Roč. 86, č. 7 (2015), , "073108-1"-"073108-6". ISSN 0034-6748. E-ISSN 1089-7623
Grant CEP: GA ČR(CZ) GA14-05053S; GA MŠMT 7E12029; GA MŠMT(CZ) LM2011026
GRANT EU: European Commission(XE) 283501 - Fast Track
Institucionální podpora: RVO:68378271
Klíčová slova: FTIR * ATR * solar cells
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 1.336, rok: 2015

Silicon heterojunction solar cells critically depend on the detailed properties of their amorphous/crystalline silicon interfaces. We report here on the use of attenuated total reflectance Fourier-transform infrared (ATR-FTIR) spectroscopy to gain precise insight into the vibrational properties of the surfaces and ultrathin layers present in such solar cells. We fabricate ATR prisms from standard silicon wafers similar to those used for device fabrication. In this fashion, we acquire very-high sensitivity FTIR information on device-relevant structures. Our method has no requirement for minimum layer thickness, enabling the study of the impact of the different fabrication process steps on the film microstructure. We discuss the necessary requirements for the method implementation and give a comprehensive overview of all observed vibration modes.
Trvalý link: http://hdl.handle.net/11104/0250873