Počet záznamů: 1
Automated CBED processing: sample thickness estimation based on analysis of zone-axis CBED pattern
- 1.0448141 - FZÚ 2016 RIV NL eng J - Článek v odborném periodiku
Klinger, Miloslav - Němec, Martin - Polívka, Leoš - Gärtnerová, Viera - Jäger, Aleš
Automated CBED processing: sample thickness estimation based on analysis of zone-axis CBED pattern.
Ultramicroscopy. Roč. 150, Mar (2015), s. 88-95. ISSN 0304-3991. E-ISSN 1879-2723
Grant CEP: GA ČR GBP108/12/G043
Institucionální podpora: RVO:68378271
Klíčová slova: TEM * CBED * thickness estimation * zone axis * computer vision * automatization
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 2.874, rok: 2015
An automated processing of convergent beam electron diffraction (CBED) patterns is presented. The proposed methods are used in an automated tool for estimating the thickness of transmission electron microscopy (TEM) samples.
Trvalý link: http://hdl.handle.net/11104/0249867
Počet záznamů: 1