Examination of Graphene with Very Slow Electrons

0437839 - ÚPT 2015 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Mikmeková, Eliška - Frank, Luděk
Examination of Graphene with Very Slow Electrons.
NANOCON 2014. 6th International conference proceedings. Ostrava: TANGER, 2014. ISBN 978-80-87294-55-0.
[NANOCON 2014. International Conference /6./. Brno (CZ), 05.11.2014-07.11.2014]
Grant CEP: GA TA ČR TE01020118; GA MŠMT(CZ) LO1212
Institucionální podpora: RVO:68081731
Klíčová slova: graphene * slow electrons * very low energy scanning electron microscopy * ultralow energy STEM
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

Although graphene has been available and intensively studied for nearly a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning electron microscopy with slow and very slow electrons offers an innovative tool enabling one to see graphene samples at nanometer or even sub-nanometer lateral resolution in both transmitted and reflected electrons and to count the number of layers reliably in both imaging modes. Diagnostics can be performed in this way on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates. Moreover, bombardment with very slow electrons acts as an ultimate cleaning procedure removing adsorbed gases from crystal surfaces which can be monitored in scanned transmission electron images taken at below 50 eV.
Trvalý link: http://hdl.handle.net/11104/0241324