Structural studies of thin Mg films

0436446 - FZÚ 2015 RIV GB eng C - Konferenční příspěvek (zahraniční konf.)
Hruška, P. - Čížek, J. - Anwand, W. - Bulíř, Jiří - Lančok, Ján - Stráská, J. - Melikhova, O. - Procházka, I.
Structural studies of thin Mg films.
Journal of Physics: Conference Series. Vol. 505. Bristol: IOP Publishing Ltd, 2014 - (Hugenschmidt, C.; Piochacz, C.), "012024-1"-"012024-4". ISSN 1742-6588.
[International workshop on slow positron beam techniques and applications /13./ (SLOPOS13). München (DE), 15.09.2013-20.09.2013]
Institucionální podpora: RVO:68378271
Klíčová slova: Mg films * VEPAS * defects
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

In the present work variable energy positron annihilation spectroscopy (VEPAS) was employed for investigation of defects in Mg films. VEPAS characterization was combined with scanning electron microscopy and X-ray diffraction in order to determine grain size and texture respectively. The aim of this study was to examine the effect of deposition temperature and various substrates on structure and defects in Mg films prepared by RF magnetron sputtering. SEM observations revealed that films deposited on sapphire (0001) substrate exhibit always smaller grains than films deposited on amorphous fused silica and silicon (100) substrates, which have comparable grain size. Defect studies by VEPAS showed that positrons in Mg films studied are trapped at misfit dislocations and at vacancy-like defects in grain boundaries. Moreover, the films deposited on a substrate heated at 300 C exhibited lower concentration of defects and larger grain size compared to the films deposited.
Trvalý link: http://hdl.handle.net/11104/0240191