Počet záznamů: 1
Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains
- 1.0423862 - ÚPT 2014 DE eng C - Konferenční příspěvek (zahraniční konf.)
Pokorná, Zuzana - Knápek, Alexandr
Scanning Low Energy Electron Microscopy for the determination of crystallographic orientation of polycrystalline metal grains.
Microscopy conference (MC) 2013. Proceedings. Vol. 2. Regensburg: University of Regensburg, 2013, s. 329-330.
[Microscopy Conference 2013. Regensburg (DE), 25.08.2013-30. 08.2013]
Institucionální podpora: RVO:68081731
Klíčová slova: SLEEM * Crystallographic orientation * polycrystalline metal * cathode lens
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Scanning Low Energy Electron Microscopy (SLEEM) is a Scanning Electron Microscopy technique in which electrons of an arbitrarily low incident energy (103–100 eV) are used. It makes use of the cathode lens principle, allowing to preserve a very good image resolution even at the lowest incident electron energies.
Trvalý link: http://hdl.handle.net/11104/0229924
Počet záznamů: 1