Quantitative Data Processing in Scanning Probe Microscopy

0423743 - FZÚ 2014 RIV GB eng M - Část monografie knihy
Klapetek, P. - Fejfar, Antonín - Rezek, Bohuslav
Local current measurements.
Quantitative Data Processing in Scanning Probe Microscopy. Oxford: Elsevier, 2013 - (Klapetek, P.), s. 221-245. Micro and Nano Technologies. ISBN 978-1-4557-3058-2
Grant CEP: GA MŠMT(CZ) LM2011026
Institucionální podpora: RVO:68378271
Klíčová slova: STM * AFM * local electronic properties * nanostructures
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
http://www.sciencedirect.com/science/book/9781455730582

Two groups of techniques based on local current flow between probe and sample in a Scanning Probe Microscope (SPM) are reviewed. Scanning tunneling microscopy and spectroscopy (STM, STS) is typically used in ultrahigh vacuum conditions for measurements of very high resolution images of atomic lattices surface reconstructions. We discuss its basics and related modeling and data interpretation approaches. Conductive Atomic Force Microscopy (C-AFM) is more often used in ambient conditions, to map local electrical properties of samples and to estimate local sample resistance based material contrast maps. Tip-sample junction models and typical artifacts of C-AFM are discussed, being illustrated by measurements on semiconducting samples, like microcrystalline solar cells.
Trvalý link: http://hdl.handle.net/11104/0229821