Force mapping on a partially H-covered Si(111)-(7x7) surface: Influence of tip and surface reactivity

0399920 - FZÚ 2014 RIV US eng J - Článek v odborném periodiku
Yurtsever, A. - Sugimoto, Y. - Tanaka, H. - Abe, M. - Morita, S. - Ondráček, Martin - Pou, P. - Pérez, R. - Jelínek, Pavel
Force mapping on a partially H-covered Si(111)-(7x7) surface: Influence of tip and surface reactivity.
Physical Review. B. Roč. 87, č. 15 (2013), "155403-1"-"155403-10". ISSN 1098-0121
Grant CEP: GA ČR(CZ) GPP204/11/P578; GA ČR GAP204/10/0952; GA AV ČR IAA100100905
Grant ostatní: GA AV ČR(CZ) M100101207
Institucionální podpora: RVO:68378271
Klíčová slova: atomic force microscopy * DFT simulations * silicon surface * surface passivation * electrostatic interaction
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 3.664, rok: 2013
http://link.aps.org/doi/10.1103/PhysRevB.87.155403

On the basis of noncontact atomic force microscopy (NC-AFM) on the Si(111)-7x7 surface, supported by density functional theory (DFT) simulations, we identify two types of NC-AFM tip termination, resulting in two characteristic modes of interaction (weaker or stronger) between the tip and the surface. We explain the existence of these two interaction modes in terms of the tip structure and interaction mechanism.
Trvalý link: http://hdl.handle.net/11104/0227067