Dynamic defectoscopy with flat panel and CdTe Timepix X-ray detectors combined with an optical camera

0399308 - ÚTAM 2014 RIV GB eng J - Článek v odborném periodiku
Vavřík, Daniel - Fauler, A. - Fiederle, M. - Jandejsek, Ivan - Jakůbek, J. - Tureček, D. - Zwerger, A.
Dynamic defectoscopy with flat panel and CdTe Timepix X-ray detectors combined with an optical camera.
Journal of Instrumentation. Roč. 8, April (2013), C04009. ISSN 1748-0221. E-ISSN 1748-0221.
[International Workshop on Radiation Imaging Detectors /14./. Figueira da Foz, Coimbra, 01.07.2012-05.07.2012]
Grant CEP: GA ČR(CZ) GA103/09/2101
Institucionální podpora: RVO:68378297
Klíčová slova: X-ray digital radiography * fracture mechanics * crack path * X-ray defectoscopy
Kód oboru RIV: JM - Inženýrské stavitelství
Impakt faktor: 1.526, rok: 2013
http://iopscience.iop.org/1748-0221/8/04/C04009/

Damage of gradually loaded ductile materials involves a number of physical processes which are highly nonlinear and have different intensity and extent. Dynamic defectoscopy (i.e. defectoscopy of time changing damage processes) combining an X-ray/optical imaging system is proposed for on-line visualization and analysis of the complex behavior of such materials. A large area flat panel detector with rather long read out time is used for overall observation of slow damage processes. On the other hand, a semiconductor CdTe Timepix detector with small active area allows following the rapid damage processes occurring in the final phase of specimen failure. Optical imaging of the specimen surface was utilized for analyzing the specimen deformations.
Trvalý link: http://hdl.handle.net/11104/0230443