Defect studies of ZnO films prepared by pulsed laser deposition on various substrates

0398548 - FZÚ 2014 RIV GB eng C - Konferenční příspěvek (zahraniční konf.)
Melikhova, O. - Čížek, J. - Procházka, I. - Kužel, R. - Novotný, Michal - Bulíř, Jiří - Lančok, Ján - Anwand, W. - Brauer, G. - Connolly, J. - McCarthy, E. - Krishnamurthy, S. - Mosnier, J.-P.
Defect studies of ZnO films prepared by pulsed laser deposition on various substrates.
ICPA 2012 - 16th International Conference on Positron Annihilation. Bristol: IOP Publishing Ltd, 2013, 012018. Journal of Physics: Conference Series, vol. 443. ISSN 1742-6588.
[International Conference on Positron Annihilation /16./, ICPA 2012. Bristol (GB), 19.08.2012-24.12.2012]
Grant CEP: GA ČR(CZ) GAP108/11/0958
Institucionální podpora: RVO:68378271
Klíčová slova: ZnO thin film * pulsed laser deposition * point defects * slow positron implantation spectroscopy * x-ray diffraction
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

ZnO thin films deposited on various substrates were characterized by slow positron implantation spectroscopy (SPIS) combined with X-ray diffraction (XRD). All films studied exhibit wurtzite structure and crystallite size 20-100 nm. The mosaic spread of crystallites is relatively small for the films grown on single crystalline substrates while it is substantial for the film grown on amorphous substrate. SPIS investigations revealed that ZnO films deposited on single crystalline substrates exhibit significantly higher density of defects than the film deposited on amorphous substrate. This is most probably due to a higher density of misfit dislocations, which compensate for the lattice mismatch between the film and the substrate.
Trvalý link: http://hdl.handle.net/11104/0226017