Počet záznamů: 1
Scanning Electron Microscopy With Slow Electrons
- 1.0398028 - ÚPT 2014 RIV US eng J - Článek v odborném periodiku
Frank, Luděk - Mikmeková, Šárka - Pokorná, Zuzana - Müllerová, Ilona
Scanning Electron Microscopy With Slow Electrons.
Microscopy and Microanalysis. Roč. 19, S2 (2013), s. 372-373. ISSN 1431-9276. E-ISSN 1435-8115
Grant CEP: GA ČR GAP108/11/2270; GA TA ČR TE01020118
Institucionální podpora: RVO:68081731
Klíčová slova: Scanning Electron Microscopy * Slow Electrons * Grain Contrast * Contrast of the Density of States * Angle-resolved BSE
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 2.161, rok: 2013
Scanning low energy electron microscopy (SLEEM) with a catode lens provides improved image resolution at low energies, an enhanced signal of secondary electrons, a completely collected signal of backscattered electron (BSE) including very low energy electrons that are traditionally abandoned, and plenty of contrast mechnism not available with fast incident electrons.
Trvalý link: http://hdl.handle.net/11104/0225603
Počet záznamů: 1