Conductive atomic force microscopy on carbon nanowalls

0389053 - FZÚ 2013 RIV NL eng J - Článek v odborném periodiku
Vetushka, Aliaksi - Itoh, T. - Nakanishi, Y. - Fejfar, Antonín - Nonomura, S. - Ledinský, Martin - Kočka, Jan
Conductive atomic force microscopy on carbon nanowalls.
Journal of Non-Crystalline Solids. Roč. 358, č. 17 (2012), s. 2545-2547. ISSN 0022-3093. E-ISSN 1873-4812
Grant CEP: GA MŠMT(CZ) LC06040; GA MŠMT(CZ) MEB061012; GA AV ČR KAN400100701; GA MŠMT 7E10061
GRANT EU: European Commission(XE) 240826 - PolySiMode
Výzkumný záměr: CEZ:AV0Z10100521
Klíčová slova: carbon nanowalls * conductive atomic force microscopy * torsion resonance mode * nanostructures
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 1.597, rok: 2012

The nanostructure of carbon nanowalls (CNWs) was investigated by Torsion Resonance (TR) Atomic Force Microscopy (AFM). In this dynamic non-contact imaging mode a cantilever oscillates torsionally and the amplitude of oscillations is used for the AFM feedback. The technique includes benefits of the semicontact (tapping) mode and at the same time allows one to measure the local conductivity. Moreover, the phase signal is much stronger and fine structures of the CNWs were observed. We also present a comparison of the results obtained by TR, tapping, and contact modes.
Trvalý link: http://hdl.handle.net/11104/0217956