Examination of metals and alloys with slow and very slow electrons

0387384 - ÚPT 2013 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Mikmeková, Šárka - Mrňa, Libor - Mikmeková, Eliška - Müllerová, Ilona - Frank, Luděk
Examination of metals and alloys with slow and very slow electrons.
METAL 2012 Conference Proceedings. 21st International Conference on Metallurgy and Materials. Ostrava: TANGER Ltd, 2012. ISBN 978-80-87294-29-1.
[METAL 2012. International Conference on Metallurgy and Materials /21./. Brno (CZ), 23.05.2012-25.05.2012]
Grant CEP: GA MPO FR-TI3/323; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: scanning low energy electron microscopy * microstructure characterization * chemical composition analysis * residual stress
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

In materials science and engineering the scanning low energy electron microscopy (SLEEM) is a technique routinely applied to investigation of advanced materials, which permits us to visualize the initial microstructure of these materials at high spatial resolution and very good sensitivity. However, this technique is only rarely used for examination of conventional materials. Here we present the SLEEM as a fast and simple tool to study also the standard materials.
Trvalý link: http://hdl.handle.net/11104/0216605