Microscopic study of electronic properties of individual components of nanostructured solar cells

0386629 - FZÚ 2013 RIV DE eng C - Konferenční příspěvek (zahraniční konf.)
Fejfar, Antonín - Neykova, Neda - Vetushka, Aliaksi - Ledinský, Martin - Itoh, T. - Nakanishi, Y. - Nakamura, S. - Vaněček, Milan - Kočka, Jan
Microscopic study of electronic properties of individual components of nanostructured solar cells.
Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition. München: WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG, 2012 - (Nowak, S.), s. 509-511. ISBN 3-936338-28-0.
[European Photovoltaic Solar Energy Conference and Exhibition (PVSEC) /17./. Frankfurt (DE), 24.09.2012-28.09.2012]
Grant CEP: GA MŠMT 7E10061; GA ČR(CZ) GAP108/11/0937; GA MŠMT(CZ) 7E09057; GA MŠMT(CZ) LM2011026; GA MPO FR-TI2/736
GRANT EU: European Commission(XE) 240826 - PolySiMode; European Commission(XE) 214134 - N2P
Grant ostatní: AVČR(CZ) M100101217
Výzkumný záměr: CEZ:AV0Z10100521
Klíčová slova: silicon thin films * nanostructures * nanowires * conductive atomic force microscopy
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

Local electronic properties and photoresponse at nanostructures for solar cells were studied by conductive atomic force microscopy (AFM) in order to assess local electronic properties with resolution down to the nanometre level. Novel approaches addressing the need to measure fragile nanostructures such as ZnO nanorods were demonstrated based on torsional resonance or peak force conductive AFM.
Trvalý link: http://hdl.handle.net/11104/0215978