Characterization of industrial materials by slow and very slow electrons

0386393 - ÚPT 2013 RIV CZ eng C - Konferenční příspěvek (zahraniční konf.)
Mikmeková, Šárka - Müllerová, Ilona - Frank, Luděk
Characterization of industrial materials by slow and very slow electrons.
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2012 - (Mika, F.), s. 45-46. ISBN 978-80-87441-07-7.
[International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./. Skalský dvůr (CZ), 25.06.2012-29.06.2012]
Institucionální podpora: RVO:68081731
Klíčová slova: low energy scanning electron microscopy * complex steels * microstructure of materials
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

Progress in materials science and engineering is inseparably connected with excellent knowledge of the correlation between materials properties and their microstructure. In our experiment an ultra-high vacuum scaning low energy electron microscope (UHV SLEEM) of an in-house design was used to observe microstructure of specimens. The UHV SLEEM is equipped with the cathode lens (CL) assembly, which enables us to observe samples at arbitrary landing energies of primary electrons. The device provides argon ion beam for in-situ cleaning of the specimen surface.
Trvalý link: http://hdl.handle.net/11104/0215702