Characterization of the local crystallinity via reflectance of very slow electrons

0384097 - ÚPT 2013 RIV US eng J - Článek v odborném periodiku
Pokorná, Zuzana - Mikmeková, Šárka - Müllerová, Ilona - Frank, Luděk
Characterization of the local crystallinity via reflectance of very slow electrons.
Applied Physics Letters. Roč. 100, č. 26 (2012), 261602:1-4. ISSN 0003-6951. E-ISSN 1077-3118
Grant CEP: GA ČR GAP108/11/2270; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: very slow electrons * crystal system * electron backscatter diffraction analyses
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 3.794, rok: 2012

The reflectance of very slow electrons from solids and its electron energy dependence are shown as characteristic for the crystal system and its spatial orientation so they can serve, e. g., to fingerprinting the orientation of grains in polycrystals. Measurements on single crystals and polycrystals are validated via electron backscatter diffraction analyses. Sensitivity of the method to fine details of crystallinity is demonstrated.
Trvalý link: http://hdl.handle.net/11104/0213844