A method of imaging ultrathin foils with very low energy electrons

0383741 - ÚPT 2013 RIV NL eng J - Článek v odborném periodiku
Müllerová, Ilona - Hovorka, Miloš - Frank, Luděk
A method of imaging ultrathin foils with very low energy electrons.
Ultramicroscopy. Roč. 119, AUG (2012), s. 79-81. ISSN 0304-3991. E-ISSN 1879-2723
Grant CEP: GA AV ČR IAA100650902; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: very low energy STEM * penetration of very slow electrons * graphene
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 2.470, rok: 2012

We demonstrate the possibility to examine the free-standing foils of thicknesses in units of nm in the scanning low energy electron microscope, using both reflected and transmitted electrons. Very high contrast has been obtained in dependence on the thickness and structure of the foil. A contribution of secondary electrons to the forward scattered electron signal is discussed and a way of suppressing it is presented. Examples of reflected, total transmitted and dark field transmitted electron signal for two graphene-like samples are shown. Dependence of the transmitted signal on the electron energy is observed.
Trvalý link: http://hdl.handle.net/11104/0213588