Počet záznamů: 1
Applications of the Scanning Low Energy Electron Microscope
- 1.0379913 - ÚPT 2012 RIV US eng J - Článek v odborném periodiku
Müllerová, Ilona - Mikmeková, Eliška - Mikmeková, Šárka - Hovorka, Miloš - Frank, Luděk
Applications of the Scanning Low Energy Electron Microscope.
Microscopy and Microanalysis. Roč. 18, S2 (2012), s. 996-997. ISSN 1431-9276. E-ISSN 1435-8115
Grant CEP: GA MPO FR-TI3/323; GA MŠMT ED0017/01/01
Institucionální podpora: RVO:68081731
Klíčová slova: scanning low energy electron microscope * cathode lens
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika
Impakt faktor: 2.495, rok: 2012
Recent applications of the Scanning Low Energy Electron Microscope (SLEEM) are presented. The device employs the electron signal reflected from the specimen as well as that transmitted through the specimen for observation throughout the full energy scale down to units of electronvolts.
Trvalý link: http://hdl.handle.net/11104/0210765
Počet záznamů: 1