Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition

0378662 - FZÚ 2013 RIV GB eng J - Článek v odborném periodiku
Novotný, Michal - Čížek, J. - Kužel, R. - Bulíř, Jiří - Lančok, Ján - Connolly, J. - McCarthy, E. - Krishnamurthy, S. - Mosnier, J.-P. - Anwand, W. - Brauer, G.
Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition.
Journal of Physics D-Applied Physics. Roč. 45, č. 22 (2012), 1-12. ISSN 0022-3727. E-ISSN 1361-6463
Grant CEP: GA ČR(CZ) GAP108/11/0958; GA ČR GP202/09/P324
Výzkumný záměr: CEZ:AV0Z10100522
Klíčová slova: ZnO thin film * pulsed laser deposition * x-ray diffraction positron implantation spectroscopy
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus
Impakt faktor: 2.528, rok: 2012
http://dx.doi.org/10.1088/0022-3727/45/22/225101

ZnO thin films were grown by pulsed laser deposition on three different substrates: sapphire (0 0 0 1), MgO (1 0 0) and fused silica (FS). The structure and morphology of the films were characterized by x-ray diffraction and scanning electron microscopy and defect studies were carried out using slow positron implantation spectroscopy (SPIS). Films deposited on all substrates studied in this work exhibit the wurtzite ZnO structure and are characterized by an average crystallite size of 20-100 nm. However, strong differences in the microstructure of films deposited on various substrates were found. The ZnO films deposited on MgO and sapphire single-crystalline substrates exhibit local epitaxy, i.e. a well-defined relation between film crystallites and the substrate. Domains with different orientation relationships with the substrate were found in both films. On the other hand, the film deposited on the FS substrate exhibits fibre texture with random lateral orientation ...
Trvalý link: http://hdl.handle.net/11104/0210077