0376613 - ÚFCH JH 2013 RIV DE eng C - Konferenční příspěvek (zahraniční konf.)
Papagelis, K. - Frank, Otakar - Tsoukleri, G. - Parthenios, J. - Novoselov, K. S. - Galiotis, C.
Axial Deformation of Monolayer Graphene under Tension and Compression.
GraphITA 2011. Selected papers from the Workshop on Fundamentals and Applications of Graphene. Heidelberg: Springer, 2012 - (Ottaviano, L.; Morandi, V.), s. 87-97. ISBN 978-3-642-20643-6.
[GraphITA 2011. L´Aquila (IT), 15.05.2011-18.05.2011]
Výzkumný záměr: CEZ:AV0Z40400503
Klíčová slova: monolayer graphene * Raman spectroscopy
Kód oboru RIV: CG - Elektrochemie
DOI: https://doi.org/10.1007/978-3-642-20644-3_11,

The mechanical response of single layer graphene is monitored by simultaneous Ramanmeasurements through the shift of either theGor 2D optical phonons, for low levels of tensile and compressive strain. In tension, important physical phenomena such as the G and 2D band splitting are discussed. The results can be used to quantify the amount of uniaxial strain, providing a fundamental tool for graphenebased nanoelectronics. In compression, graphenes of atomic thickness embedded in plastic beams are found to exhibit remarkable high compression failure strains. The critical buckling strain for graphene appears to be dependent on the flake size and geometry with respect to the strain axis. It is shown that the embedded flakes can be treated as ideal plates and their behavior can be described by Euler mechanics.

Trvalý link: http://hdl.handle.net/11104/0208969