0375054 - FZÚ 2012 RIV US eng C - Conference Paper (international conference)
Fejfar, Antonín - Klapetek, P. - Zlámal, J. - Vetushka, Aliaksi - Ledinský, Martin - Kočka, Jan
Microscopic characterizations of nanostructured silicon thin films for solar cells.
Amorphous and Polycrystalline Thin-Film Silicon Science and Technology. Warrendale: MRS, 2011 - (Yan, B.; Higashi, S.; Tsai, C.; Wang, Q.; Gleskova, H.), s. 313-321. MRS Symposium Proceeding, 1321. ISBN 9781605112985.
[Materials Research Society Spring Meeting. San Francisko (US), 25.04.2011-29.04.2011]
R&D Projects: GA MŠMT(CZ) LC06040; GA MŠMT(CZ) MEB061012; GA AV ČR KAN400100701; GA MŠMT LC510
Grant - others:7. Framework programme EU(XE) no. 240826
Institutional research plan: CEZ:AV0Z10100521
Keywords : silicon * scanning probe methods * solar cells
Subject RIV: BM - Solid Matter Physics ; Magnetism

Microscopic characterization of mixed phase silicon thin films by conductive atomic force microscopy (C-AFM) was used to study the structure composed of conical microcrystalline grains dispersed in amorphous matrix. C-AFM experiments were interpreted using simulations of electric field and current distributions. Density of absorbed optical power was calculated by numerically solving the Maxwell equations. The goal of this study is to combine both models in order to simulate local photoconductivity for understanding the charge photogeneration and collection in nanostructured solar cells.
Permanent Link: http://hdl.handle.net/11104/0207821