InGaAs and GaAsSb strain reducing layers covering InAs/GaAs quantum dots

0373041 - FZÚ 2012 US eng A - Abstrakt
Hospodková, Alice - Hulicius, Eduard - Oswald, Jiří - Pangrác, Jiří - Hazdra, P. - Caha, O. - Vyskočil, Jan - Kuldová, Karla
InGaAs and GaAsSb strain reducing layers covering InAs/GaAs quantum dots.
The 14th US Biennial Workshop on Organometallic Vapor Phase Epitaxy. 2009 Abstract Book. Warren: American Association for Crystal Growth, 2009. s. 68. ISBN N.
[US Biennial Workshop on Organometallic Vapor Phase Epitaxy /14./. 09.08.2009-14.08.2009, Lake Geneva, Wisconsin]
Grant CEP: GA ČR GA202/09/0676
Klíčová slova: low dimensional structures * photoluminescence * low-pressure MOVPE * InAs/GaAs quantum dots * semiconducting III/V materials
Kód oboru RIV: BM - Fyzika pevných látek a magnetismus

We compare properties of InAs/GaAs quantum dots (QDs) covered by InGaAs or GaAsSb strain reducing layers (SRLs) prepared by metal organic vapor phase epitaxy. Stronger red shift of QD emission was achieved with InGaAs SRL as compared to GaAsSb one with similar strain in the structure.This can be caused by the increase of QD size during InGaAs SRL growth. The heterojunction between InAs QDs and GaAsSb SRL changes from type I to type II between 13% and 15% of Sb in the SRL. Important advantage of GaAsSb SRL can be the possibility to change the overlap of electron and hole wave functions and QD dipole moment orientation by the composition of GaAsSb. We have achieved the highest PL intensity suggesting best wave function overlap near 13% of Sb in the SRL. Band alignment, transition probability and transition energy were modeled to help the interpretation of achieved results.
Trvalý link: http://hdl.handle.net/11104/0006873