The Characterisation of Silicate Glasses Implanted with Ag+ Ions

0370848 - ÚJF 2013 RIV US eng C - Konferenční příspěvek (zahraniční konf.)
Malinský, Petr - Macková, Anna - Nekvindová, P. - Švecová, B. - Kormunda, M. - Kolitsch, A.
The Characterisation of Silicate Glasses Implanted with Ag+ Ions.
AIP Conference Proceedings. Melville: American Institute of Physics, 2011, s. 327-334. ISBN 978-0-7354-0986-6. ISSN 0094-243X.
[11th International Conference on Applications of Nuclear Techniques. Crete (GR), 12.06.2011-18.06.2011]
Grant CEP: GA ČR GA106/09/0125
Výzkumný záměr: CEZ:AV0Z10480505
Klíčová slova: ion implantation * silicate glasses * metal nanoparticles * Rutherford Backscattering Spectroscopy * optical absorption
Kód oboru RIV: BG - Jaderná, atomová a mol. fyzika, urychlovače

Silica-based glasses containing silver nanoparticles have been shown to be promising materials in photonic applications. Various silica-based glasses were implanted with 1.7 MeV Ag+ ions with fluences of 1x1016 cm-2 and annealed at 600 °C for 5 hours. The concentration depth profiles were characterised using Rutherford Backscattering Spectrometry (RBS) and X-ray Photoelectron Spectroscopy (XPS). The measured concentration depth profiles of the implanted Ag atoms were compared with the theoretically predicted implantation profiles simulated by SRIM-2008. The optical properties of the prepared nanostructures were examined by UV-VIS spectroscopy. It was found that the composition and structure of the glass has an influence on the penetration of the implanted ions during the implantation and post-implantation annealing, on the oxidation state of silver present in the glass matrix and on the resulting optical properties.
Trvalý link: http://hdl.handle.net/11104/0204531