Examination of ultrathin films with slow electrons

0367236 - ÚPT 2012 IT eng C - Konferenční příspěvek (zahraniční konf.)
Müllerová, Ilona - Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk
Examination of ultrathin films with slow electrons.
Proceedings of the 10th Multinational Congress on Microscopy 2011. Urbino: SISM, 2011, s. 59-60.
[Multinational Congress on Microscopy 2011 /10./ - MCM 2011. Urbino (IT), 04.09.2011-09.09.2011]
Grant CEP: GA AV ČR IAA100650902
Výzkumný záměr: CEZ:AV0Z20650511
Klíčová slova: low energy electrons * scanning electron microscope * transmitted electrons * reflected electrons
Kód oboru RIV: JA - Elektronika a optoelektronika, elektrotechnika

Ultrathin coatings of surfaces and ultrathin free-standing films like graphene have become hot topic for fundamental research of physical properties of 2D crystals, oriented to their crystallinic and electronic structure. Transmission of slow electrons through films provides data about directions of a high density of electron states and about inner potential while reflection of electrons enables one to study the crystallinic structure. A method has been developed for simultaneous acquisition of transmitted and reflected fluxes of slow electrons.
Trvalý link: http://hdl.handle.net/11104/0201982